1.
 |  | Title: Semiconductor Measurements and Instrumentation
by W. R. Runyan, T. J. Shaffner
ISBN: 0070576971
Publisher: McGraw-Hill Professional
Pub. Date: 01 February, 1998
List Price: $70.00
Amazon.com Price: $70.00 |
2.
|  | Title: Characterization and Metrology for Ulsi Technology: 2000 International Conference (Aip Conference Proceedings, 550)
by David G. Seiler, A. C. Diebold, T. J. Shaffner, R. McDonald, W.M. Bullis, P.J. Smith, E.M. Secula, International Conference on Characterization and Metrology for Ulsi Te
ISBN: 156396967X
Publisher: Amer Inst of Physics
Pub. Date: March, 2001
List Price: $185.00
Amazon.com Price: $185.00 |
3.
|  | Title: Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449)
by David G. Seiler, A.C. Diebold, W.M. Bullis, T.J. Shaffner, R. McDonald, E.J. Walters, International Conference on Characterization and Metrology for Ulsi Te
ISBN: 1563967537
Publisher: Springer Verlag
Pub. Date: December, 1998
List Price: $195.00
Amazon.com Price: $195.00 |
4.
|  | Title: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices (Proceedings of S P I E, 3322)
by P. Rai-Choudhury, J. L. Benton, D. K. Schroder, T. J. Shaffner
ISBN: 0819427659
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: October, 1997
List Price: $70.00
Amazon.com Price: $70.00 |
