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1. |  | Title: Characterization and Metrology for Ulsi Technology: 2000 International Conference (Aip Conference Proceedings, 550) by David G. Seiler, A. C. Diebold, T. J. Shaffner, R. McDonald, W.M. Bullis, P.J. Smith, E.M. Secula, International Conference on Characterization and Metrology for Ulsi Te ISBN: 156396967X Publisher: Amer Inst of Physics Pub. Date: March, 2001 List Price: $185.00 Amazon.com Price: $185.00 |
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