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1. |  | Title: High Resolution X-Ray Diffractometry Topography by D. Keith Bowen, Brian K. Tanner, B. K. Tanner ISBN: 0850667585 Publisher: CRC Press Pub. Date: 15 August, 1998 List Price: $99.95 Amazon.com Price: $99.95 |
| 2. |  | Title: Advances in X-Ray Analysis (Vol 38, Proceedings of the 43rd Annual Conference) by Paul K. Predecki, D. Keith Bowen, John V. Gilfrich, Charles C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Deane K. Smith ISBN: 0306450453 Publisher: Plenum Publishing Corporation Pub. Date: 01 November, 1995 List Price: $297.00 Amazon.com Price: $297.00 |
| 3. |  | Title: Microscopy of materials: Modern imaging methods using electron, X-ray, and ion beams by D. Keith Bowen ISBN: 0470092173 Publisher: Wiley Pub. Date: 1975 List Price: $29.95 Amazon.com Price: $29.95 |
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