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Title: High Resolution X-Ray Diffractometry Topography by D. Keith Bowen, Brian K. Tanner, Keith D. Bowen ISBN: 0-85066-758-5 Publisher: T&F STM Pub. Date: 15 August, 1998 Format: Hardcover Volumes: 1 List Price(USD): $99.95

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Average Customer Rating: 5 (1 review)

Rating: 5
Summary: A review
Comment: This is a new generation book. Most books available in the field cover the whole history of the X-ray scattering theories and applications. Then, specific applications that are very important in our days for industries and scientific researches are not properly treated. This book does begin where other related books have finished. The issues covered are not found anywhere else together, in a same volume, as they are here. It is fundamental to the new era of materials characterization.