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1. |  | Title: Advances in X-Ray Analysis by Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins ISBN: 0306436159 Publisher: Plenum Pub Corp Pub. Date: December, 1990 List Price: $234.00 Amazon.com Price: $234.00 |
| 2. |  | Title: Advances in Surface and Thin Film Diffraction: Symposium Held November 27-29, 1990, Boston, Massachusetts, U.S.A. (Materials Research Society Sympos) by Ting C. Huang, Philip I. Cohen, David J. Eaglesham ISBN: 155899100X Publisher: Material Research Society Pub. Date: April, 1991 List Price: $50.00 Amazon.com Price: $50.00 |
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