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Cover ImageTitle: Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)
by Noble M. Johnson, Stephen G. Bishop, George D. Watkins
ISBN: 0931837111
Publisher: Material Research Society
Pub. Date: September, 1985
List Price: $50.00
Amazon.com Price: $50.00
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Cover ImageTitle: Hydrogen in Semiconductors (Semiconductors and Semimetals, 34)
by Jacques I. Pankove, Noble M. Johnson, Albert C. Beer, Robert K. Willardson
ISBN: 0127521348
Publisher: Academic Press
Pub. Date: October, 1997
List Price: $204.00
Amazon.com Price: $204.00

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