AnyBook4Less.com - ISBN: 0931837111 - Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials) by Noble M. Johnson

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Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)

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Title: Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)
by Noble M. Johnson, Stephen G. Bishop, George D. Watkins
ISBN: 0-931837-11-1
Publisher: Material Research Society
Pub. Date: September, 1985
Format: Hardcover
List Price(USD): $50.00

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