1.
 |  | Title: Developments in Materials Characterization Technologies: Symposium Held 23 and 24 July 1995, During the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, usa
by George F. Vander Voort, John J. Friel, George F. Vander Voort, International Metallographic Society Technical Meeting 1995 Albuquerq
ISBN: 087170580X
Publisher: International Metallographic Society
Pub. Date: 01 September, 1996
List Price: $94.00
Amazon.com Price: $94.00 |
2.
|  | Title: Practical Guide to Image Analysis
by John J. Friel
ISBN: 0871706881
Publisher: ASM International
Pub. Date: 15 January, 2000
List Price: $159.00
Amazon.com Price: $159.00 |
3.
|  | Title: X-ray and image analysis in electron microscopy
by John J Friel
ISBN: 0964145502
Publisher: Princeton Gamma-Tech
Pub. Date: 1995
|
4.
|  | Title: Microbeam Analysis: Proceedings of the 28th Annual Mas Meeting : New Orleans, LA July 31-August 5, 1994
by John J. Friel
ISBN: 1560816805
Publisher: John Wiley & Sons Inc
Pub. Date: 01 July, 1994
List Price: $69.95
Amazon.com Price: $69.95 |
