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1. |  | Title: Developments in Materials Characterization Technologies: Symposium Held 23 and 24 July 1995, During the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, usa by George F. Vander Voort, John J. Friel, George F. Vander Voort, International Metallographic Society Technical Meeting 1995 Albuquerq ISBN: 087170580X Publisher: International Metallographic Society Pub. Date: 01 September, 1996 List Price: $94.00 Amazon.com Price: $94.00 |
| 2. |  | Title: Advances and Applications in the Metallography and Characterization of Materials and Microelectronic Components: Proceedings of the Twenty-Eighth Annual Technical Meeting of the International Metallographic Society by International Metallographic Society Technical Meeting 1995 Albuquerq, E. Clark, D. Zipperian, E.D. Albrecht, D. Stevens, D. W. Stevens ISBN: 0871705702 Publisher: International Metallographic Society Internat Pub. Date: 01 September, 1996 List Price: $108.00 Amazon.com Price: $108.00 |
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