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1. |  | Title: Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits: 21-25 July, 1997, Raffles City Convention Centre, Singapore by International Symposium on the Physical, Failure Analysis of Integrat, Philip Ho, Chim Wai Kin, M. K. Radhakrishnan, Wai Kin Chim, IEEE Singapore Section Reliability, Cpmt, Eda Chapter, IEEE Electron Devices Society ISBN: 0780339851 Publisher: IEEE Pub. Date: June, 1997 List Price: $116.00 Amazon.com Price: $116.00 |
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