1.
 |  | Title: Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits: 21-25 July, 1997, Raffles City Convention Centre, Singapore
by International Symposium on the Physical, Failure Analysis of Integrat, Philip Ho, Chim Wai Kin, M. K. Radhakrishnan, Wai Kin Chim, IEEE Singapore Section Reliability, Cpmt, Eda Chapter, IEEE Electron Devices Society
ISBN: 0780339851
Publisher: IEEE
Pub. Date: June, 1997
List Price: $116.00
Amazon.com Price: $116.00 |
2.
|  | Title: Nineteenth Ieee/Cpmt International Electronics Manufacturing Technology Symposium: October 14-16, 1996 Austin, Tx USA
by Ieee, Cpmt International Electronics Manufacturing Technology Symposium, IEEE Components
ISBN: 0780336429
Publisher: IEEE
Pub. Date: October, 1996
List Price: $128.00
Amazon.com Price: $128.00 |
3.
|  | Title: Electronics Manufacturing Tehnology Symposium, 1998 22nd IEEE/CPMT
by Ieee, Cpmt International Electronics Manufacturing Technology Symposium, IEEE Components Packaging & Manufacturin, IEEE Industry Applications Society
ISBN: 0780345207
Publisher: IEEE
Pub. Date: May, 1998
List Price: $122.00
Amazon.com Price: $122.00 |
4.
|  | Title: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits: Ipfa 2001
by International Symposium on the Physical, Failure Analysis of Integrat, IEEE Electron Devices Society, Wilson Tan, IEEE Reliability, Cpmt, Ed Singapore Chapter
ISBN: 0780366751
Publisher: IEEE
Pub. Date: December, 2001
List Price: $140.00
Amazon.com Price: $140.00 |
