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1. |  | Title: 1999 4th International Symposium on Plasma Process-Induced Damage by Thuy Dao, M. Koyanagi, Terence Hook, IEEE Electron Devices Society, IEEE, Th&&&& ISBN: 0965157733 Publisher: IEEE Pub. Date: November, 1999 List Price: $122.00 Amazon.com Price: $122.00 |
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