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Cover ImageTitle: Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17)
by Michael L. Bushnell, Vishwani D. Agrawal, Michael J. Bushnell
ISBN: 0792379918
Publisher: Kluwer Academic Publishers
Pub. Date: 01 November, 2000
List Price: $135.00
Amazon.com Price: $135.00
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Cover ImageTitle: Neural Models and Algorithms for Digital Testing (Kluwer International Series in Engineering and Computer Science, 140)
by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell
ISBN: 0792391659
Publisher: Kluwer Academic Publishers
Pub. Date: July, 1991
List Price: $139.00
Amazon.com Price: $139.00
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Cover ImageTitle: Tutorial: Test Generation for Vlsi Chips
by Vishwani D. Agrawal, Sharad C. Seth
ISBN: 081868786X
Publisher: IEEE Computer Society
Pub. Date: September, 1988
List Price: $30.00
Amazon.com Price: $30.00

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