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1. |  | Title: Electron Microscopy and Analysis by Peter J. Goodhew, F. J. Humphreys, R. Beanland ISBN: B0000T7XA6 Publisher: Taylor and Francis List Price: $41.95 Amazon.com Price: $41.95 |
| 2. |  | Title: Microscopy of Semiconducting Materials 1999: Proceedings of the Institute of Physics Conference Held at Oxford University, 22-25 March 1990 (Institute of Physics Conference, 164) by A. G. Cullis, R. Beanland ISBN: 0750306505 Publisher: Institute of Physics Publishing Pub. Date: March, 2000 List Price: $275.00 Amazon.com Price: $275.00 |
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