1.
 |  | Title: Rough Surface Scattering and Contamination: 21-23 July 1999, Denver, Colorado (Proceedings of Spie--The International Society for Optical Engineering, V. 3784.)
by Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin
ISBN: 0819432709
Publisher: Society of Photo Optical
Pub. Date: 01 October, 1999
List Price: $92.00
Amazon.com Price: $92.00 |
2.
|  | Title: Optical Systems Contamination and Degradation: 20-23 July 1998, San Diego, California (Proceedings of Spie--The International Society for Optical Engineering, V. 3427.)
by Philip T. Chen, William E. McClintock, Gary J. Rottman, Society of Photo-Optical Instrumentation Engineers
ISBN: 0819428825
Publisher: Society of Photo Optical
Pub. Date: 01 October, 1998
List Price: $89.00
Amazon.com Price: $89.00 |
3.
|  | Title: Optical Systems Contamination and Degredation: Effects, Measurements, and Control (Optical Systems Contamination & Degradation)
by Philip T. Chen, O. M. Uy
ISBN: 0819437417
Publisher: SPIE-International Society for Optical Engine
Pub. Date: October, 2000
List Price: $65.00
Amazon.com Price: $65.00 |
4.
|  | Title: Optical System Contamination: Effects, Measurements and Control VIII (Proceedings of SPIE)
by Philip T. Chen, O.M. Uy Johns
ISBN: 081944541X
Publisher: Society of Photo-Optical Instrumentation Engineers (SPIE)
Pub. Date: September, 2002
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