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1. |  | Title: Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein, Dale Newbury, Patrick Kchlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael ISBN: 0306472929 Publisher: Kluwer Academic Publishers Pub. Date: February, 2003 List Price: $75.00 Amazon.com Price: $75.00 |
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