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Cover ImageTitle: Nist Janaf Thermochemical Tables (Journal of Physical and Chemical Reference Data. Monograph, No. 9)
by M. W. Chase, National Institute of Standards and Technology (U.S.)
ISBN: 1563968312
Publisher: Amer Inst of Physics
Pub. Date: October, 1998
List Price: $195.00
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Cover ImageTitle: Micromachining and Microfabrication Process Technology: 23-24 October, 1995, Austin, Texas (Proceedings of Spie--The International Society of Optical Engineering, V. 2639.)
by Karen W. Markus, Semiconductor Equipment and Materials International, National Institute of Standards and Technology (U.S.), Society of Photo-Optical Instrumentation Engineers
ISBN: 0819420050
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: September, 1995
List Price: $66.00
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Cover ImageTitle: Polynuclear Aromatic Hydrocarbons: Measurements, Means, and Metabolism
by International Symposium on Polynuclear Aromatic Hydrocarbons 1987 Gai, Kurt Loening, Joy Merritt, Marcus Cooke, National Cancer Institute (U.S.), National Institute of Standards and Technology (U.S.)
ISBN: 0935470581
Publisher: Battelle Pr
Pub. Date: August, 1990
List Price: $82.50
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Cover ImageTitle: Microelectronic Structures and Microelectromechanical Devices: 24 October, 1995, Austin, Texas (Proceedings of Spie--The International Society for Optical Engineering, V. 2641.)
by Wayne E. Bailey, M. Edward Motamedi, Fang-Chen Luo, Semiconductor Equipment and Materials International, National Institute of Standards and Technology (U.S.), Society of Photo-Optical Instrumentation Engineers
ISBN: 0819420077
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: September, 1995
List Price: $46.00
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Cover ImageTitle: Machine Vision Applications, Architectures and Systems Integration VI: 15-16 October 1997, Pittsburgh, Pennsylvania (Spie Proceedings, Vol 3205)
by Bruce G. Batchelor, Susan Soloman, Susan Snell Solomon, John W. V. Miller, Society of Photo-Optical Instrumentation Engineers, Machine Vision Association of Sme, National Institute of Standards and Technology
ISBN: 0819426377
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: September, 1997
List Price: $69.00
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Cover ImageTitle: Micromachined Devices and Components 23 24 October 1995: 23-24 October, 1995, Austin, Texas (Proceedings of Spie--The International Society for Optical Engineering, V. 2642.)
by Ray Roop, Kevin Chau, Semiconductor Equipment and Materials International, Society of Photo-Optical Instrumentation Engineers, National Institute of Standards and Technology (U.S.), Society of Photo-Optical Instrumentation
ISBN: 0819420085
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: September, 1995
List Price: $66.00
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Cover ImageTitle: Microlithography and Metrology in Micromachining 23 24 October 1995 : 23-24 October, 1995, Austin, Texas
by Michael T. Postek, Semiconductor Equipment and Materials Institute, National Institute of Standards and Technology (U.S.), Society of Photo-Optical Instrumentation Engineers
ISBN: 0819420069
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: September, 1995
List Price: $66.00
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Cover ImageTitle: Metrology and Properties of Engineering Surfaces: Proceedings of the Fourth International Conference, Washington DC, April 1988
by Edited by K J Stout University of Birmingham UK and Editor of the journal Surface Topography and T V Vorburger Centre for Manufacturing Engineering National Institute of Standards and Technology USA
ISBN: 1850919380
Publisher: Kluwer Academic Publishers Group
Pub. Date: 31 May, 1989

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