1.
 |  | Title: High Voltage Integrated Circuits (IEEE Press Selected Reprint Series) by B. Jayant Baliga, Ieee Electron Devices Society, J. Baliga ISBN: 0879422424 Publisher: IEEE Pub. Date: December, 1988 List Price: $54.95 Amazon.com Price: $54.95 |
2.
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3.
 |  | Title: Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory: Proceedings of Ivth International Seminar/Workshop: (Lviv, September 20-23, 1999) by International Seminar, Workshop on Direct and Inverse Problems of Elect, IEEE Microwave Theory & Techniques Socie, IEEE Electron Devices Society ISBN: 9660208642 Publisher: IEEE Pub. Date: January, 2000 List Price: $112.00 Amazon.com Price: $112.00 |
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 |  | Title: Microwave Conference "Microwave & Telecommunication Technology", 2001 11th International Crimean by IEEE Electron Devices Society ISBN: 9667968006 Publisher: IEEE Pub. Date: September, 2001 List Price: $186.00 Amazon.com Price: $186.00 |
5.
 |  | Title: 17th Nrsc'2000: Seventeenth National Radio Science Conference by IEEE Electron Devices Society, IEEE, Ex&&& ISBN: 9775031648 Publisher: IEEE Pub. Date: August, 2000 List Price: $182.00 Amazon.com Price: $182.00 |
6.
 |  | Title: Electrical Overstress/Electrostatic Discharge Symposium (Eos/Esd): 2000 22nd Annual Symposium by IEEE Electron Devices Society ISBN: 1585370185 Publisher: IEEE Pub. Date: May, 2000 List Price: $162.00 Amazon.com Price: $162.00 |
7.
 |  | Title: Modulation-Doped Field-Effect Transistors: Principles, Design and Technology by Heinrich Daembkes, Ieee Electron Devices Society ISBN: 0879422556 Publisher: IEEE Pub. Date: December, 1991 List Price: $59.95 Amazon.com Price: $59.95 |
8.
 |  | Title: 1999 4th International Symposium on Plasma Process-Induced Damage by Thuy Dao, M. Koyanagi, Terence Hook, IEEE Electron Devices Society, IEEE, Th&&&& ISBN: 0965157733 Publisher: IEEE Pub. Date: November, 1999 List Price: $122.00 Amazon.com Price: $122.00 |
9.
 |  | Title: Plasma & Process-Induced Damage, 2001: 6th International Symposium by IEEE Electron Devices Society, Manfred Engelhardt ISBN: 096515775X Publisher: IEEE Pub. Date: October, 2001 List Price: $140.00 Amazon.com Price: $140.00 |
10.
 |  | Title: International Symposium on Plasma and Process-Induced Damage: 1996-2001 Proceedings by IEEE Electron Devices Society, Manfred Engelhardt ISBN: 0965157768 Publisher: IEEE Pub. Date: October, 2001 List Price: $140.00 Amazon.com Price: $140.00 |