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1. |  | Title: Electromigration and Electronic Device Degradation by Aris Christou ISBN: 0471584894 Publisher: Wiley-Interscience Pub. Date: December, 1993 List Price: $130.00 Amazon.com Price: $130.00 |
| 2. |  | Title: Integrating Reliability into Microelectronics Manufacturing by Aris Christou ISBN: 0471944076 Publisher: John Wiley & Sons Pub. Date: 16 June, 1994 List Price: $225.00 Amazon.com Price: $225.00 |
| 3. |  | Title: Reliability of Gallium Arsenide Mmics (Design and Measurement in Electronic Engineering) by Aris Christou ISBN: 0471934909 Publisher: John Wiley & Sons Inc Pub. Date: 01 October, 1992 List Price: $177.45 Amazon.com Price: $177.45 |
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