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1. |  | Title: Semiconductor Characterization: Present Status and Future Needs by W. Murray Bullis, D. G. Seiler, A. C. Diebold ISBN: 1563965038 Publisher: Springer Verlag Pub. Date: August, 1996 List Price: $98.00 Amazon.com Price: $98.00 |
| 2. |  | Title: Semiconductor measurement technology evolution of silicon materials characterization : lessons learned for improved manufacturing (SuDoc C 13.10:400-92) by W. Murray Bullis ISBN: B00010IMHC Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology Pub. Date: 1993 |
| 3. |  | Title: Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry (SuDoc C 13.10:400-98) by W. Murray Bullis ISBN: B00010THAI Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology Pub. Date: 1995 |
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