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1. |  | Title: Diagnostic Techniques for Semiconductor Materials Processing II: Symposium Held November 27-30, 1995, Boston, Massachusetts, U.S.A (Materials Research Society Symposia Proceedings, Vol 406) by Stella W. Pang, Orest J. Glembocki, Fred H. Pollak, Francis G. Celii, Clivia M. Sotomayor Torres ISBN: 1558993096 Publisher: Material Research Society Pub. Date: February, 2000 List Price: $67.00 Amazon.com Price: $67.00 |
| 2. |  | Title: Spectroscopic Characterization Techniques for Semiconductor Technology IV: 25-26 March 1992 Somerset, New Jersey (Spie Proceedings, Vol 1678) by Orest J. Glembocki ISBN: 0819408395 Publisher: SPIE--The International Society for Optical Engineering Pub. Date: October, 1992 List Price: $30.00 Amazon.com Price: $30.00 |
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