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Cover ImageTitle: Machine Vision Systems for Inspection and Metrology VIII: 21-22 September 1999, Boston, Massachusetts (Proceedings of Spie--The International Society for Optical Engineering, V. 3836.)
by John W.V. Miller, Susan S. Solomon, Bruce G. Batchelor, Society of Photo-Optical Instrumentation Engineers
ISBN: 0819434299
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: August, 1999
List Price: $72.00
Amazon.com Price: $72.00
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Cover ImageTitle: Machine Vision Applications, Architectures and Systems Integration VI: 15-16 October 1997, Pittsburgh, Pennsylvania (Spie Proceedings, Vol 3205)
by Bruce G. Batchelor, Susan Soloman, Susan Snell Solomon, John W. V. Miller, Society of Photo-Optical Instrumentation Engineers, Machine Vision Association of Sme, National Institute of Standards and Technology
ISBN: 0819426377
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: September, 1997
List Price: $69.00
Amazon.com Price: $69.00
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Cover ImageTitle: Progress in Simulation (Vol 3. Issn 1078-0483)
by George W. Zobrist, James V. Leonard, John A. Miller, Orville R. Weyrich, John E. Stark
ISBN: 0893916811
Publisher: Ablex Publishing
Pub. Date: December, 1996
List Price: $78.50
Amazon.com Price: $78.50
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Cover ImageTitle: Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology
by Kevin G. Harding, John W. V. Miller, Bruce G. Batchelor
ISBN: 0819438545
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: February, 2001
List Price: $75.00
Amazon.com Price: $75.00

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