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1. |  | Title: Hierarchical Modeling for Vlsi Circuit Testing (Kluwer International Series in Engineering and Computer Science, 89) by Debashis Bhattacharya, John P. Hayes, Debashish Bhattacharjee ISBN: 079239058X Publisher: Kluwer Academic Publishers Pub. Date: February, 1990 List Price: $134.00 Amazon.com Price: $134.00 |
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