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1. |  | Title: Defects and Diffusion in Silicon Processing: Symposium Held April 1-4, 1997, San Francisco, California, U.S.A (Materials Research Society Symposia Proceedings, V. 469.) by Tomas Diaz De LA Rubia, Salvatore Coffa, Peter A. Stolk, Conor S. Rafferty, Tomas Diaz De La Rubia ISBN: 1558993738 Publisher: Material Research Society Pub. Date: February, 2000 List Price: $19.50 Amazon.com Price: $19.50 |
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