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1. |  | Title: Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Dale E. Newbury, David C. Joy, Patrick Echlin, Charles E. Fiori, Joseph I. Goldstein ISBN: 0306421402 Publisher: Plenum Publishing Corporation Pub. Date: 01 February, 1986 List Price: $83.00 Amazon.com Price: $83.00 |
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