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Title: Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (2nd Ed)(Springer Series in Optical Sciences, Vol 45) by Ludwig Reimer, T. Tamir, A. L. Schawlow ISBN: 3-540-63976-4 Publisher: Springer Verlag Pub. Date: October, 1998 Format: Hardcover Volumes: 1 List Price(USD): $99.00 |
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Title: Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein, Dale Newbury, Patrick Kchlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael, Mark Staniforth ISBN: 0306472929 Publisher: Kluwer Academic Publishers Pub. Date: February, 2003 List Price(USD): $75.00 |
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