AnyBook4Less.com - ISBN: 089252829X - Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices (Proceedings of Spie, the International Society for Optical) by O.J. Glembocki

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Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices (Proceedings of Spie, the International Society for Optical)

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Title: Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices (Proceedings of Spie, the International Society for Optical)
by O.J. Glembocki, Fred H. Pollak, J.J. Song
ISBN: 0-89252-829-X
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: June, 1987
Format: Paperback
List Price(USD): $50.00

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