AnyBook4Less.com - ISBN: 0892524871 - Spectroscopic Characterization Techniques for Semiconductor Technology (Proceedings of Spie-The International Society for Optical Engineering Vol 452) by Fred H. Pollak

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Spectroscopic Characterization Techniques for Semiconductor Technology (Proceedings of Spie-The International Society for Optical Engineering Vol 452)

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Title: Spectroscopic Characterization Techniques for Semiconductor Technology (Proceedings of Spie-The International Society for Optical Engineering Vol 452)
by Fred H. Pollak, Robert S. Bauer
ISBN: 0-89252-487-1
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: February, 1984
Format: Paperback
List Price(USD): $43.00

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