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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

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Title: Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
by Pradeep Lall, Michael G. Pecht, Edward B. Hakim
ISBN: 0-8493-9450-3
Publisher: CRC Press
Pub. Date: 24 April, 1997
Format: Hardcover
Volumes: 1
List Price(USD): $69.95
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