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Interferometry XI: Techniques and Analysis, 8-10 July 2002, Seattle USA

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Title: Interferometry XI: Techniques and Analysis, 8-10 July 2002, Seattle USA
by Keith B. Doyle
ISBN: 0-8194-4544-4
Publisher: SPIE-International Society for Optical Engine
Pub. Date: January, 2002
Format: Hardcover
Volumes: 1
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