AnyBook4Less.com - ISBN: 081943096X - Testing, Packaging, Reliability and Applications of Semiconductor Lasers IV (Proceedings of Spie--The International Society for Optical Engineering, V. 3626) by Mahmoud Fallahi

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Testing, Packaging, Reliability and Applications of Semiconductor Lasers IV (Proceedings of Spie--The International Society for Optical Engineering, V. 3626)

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Title: Testing, Packaging, Reliability and Applications of Semiconductor Lasers IV (Proceedings of Spie--The International Society for Optical Engineering, V. 3626)
by Mahmoud Fallahi, Kurt J. Linden, S. C. Wang
ISBN: 0-8194-3096-X
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: April, 1999
Format: Paperback
Volumes: 1
List Price(USD): $72.00

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