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Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing: Isle of Bendor, France, 10-12 July 2002

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Title: Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing: Isle of Bendor, France, 10-12 July 2002
by Bernard Courtois, Thomas Wik, Yervant Zorian, IEEE Computer Society
ISBN: 0-7695-1617-3
Publisher: IEEE
Pub. Date: September, 2002
Format: Paperback
Volumes: 1
List Price(USD): $143.00

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