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Characterization in Silicon Processing (Materials Characterization)

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Title: Characterization in Silicon Processing (Materials Characterization)
by Yale Strausser, C.R. Brundle, Gary E. McGuire, Lee E. Fitzpatrick
ISBN: 0-7506-9172-7
Publisher: Butterworth-Heinemann
Pub. Date: January, 1994
Format: Hardcover
Volumes: 1
List Price(USD): $84.95
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