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Title: Introduction to Conventional Transmission Electron Microscopy by Marc De Graef ISBN: 0-521-62995-0 Publisher: Cambridge University Press Pub. Date: 27 March, 2003 Format: Paperback Volumes: 1 List Price(USD): $70.00 |
Average Customer Rating: 5 (1 review)
Rating: 5
Summary: Excellent
Comment: I took Prof. de Graef's class at CMU in 2001, and we used pre-prints of this text. Even in that mostly-finished form, it was excellent. It's only improved now that I have the finished, published form.
Although I found the mathematical formalism that makes up the middle of this book excessive, it is important for people who will be modelling TEM experiments. The remainder of the book, on TEM basics, operation, and image/SADP interpretation, are all excellent.
This book is an excellent CTEM text.
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Title: Scanning Probe Microscopy: The Lab on a Tip by Hans Josef Hug, Roland Bennewitz, Ernst Meyer ISBN: 3540431802 Publisher: Springer Verlag Pub. Date: November, 2003 List Price(USD): $79.95 |
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Title: Transmission Electron Microscopy : A Textbook for Materials Science (4 volumes) by David B. Williams, C. Barry Carter ISBN: 030645324X Publisher: Plenum Pr Pub. Date: September, 1996 List Price(USD): $83.00 |
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Title: Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein, Dale Newbury, Patrick Kchlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael, Mark Staniforth ISBN: 0306472929 Publisher: Kluwer Academic Publishers Pub. Date: February, 2003 List Price(USD): $75.00 |
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Title: Scanning and Transmission Electron Microscopy: An Introduction by Stanley L. Flegler, John W. Heckman, Karen L. Klomparens ISBN: 0195107519 Publisher: Oxford University Press Pub. Date: June, 1997 List Price(USD): $54.95 |
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