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Title: Built In Test for VLSI: Pseudorandom Techniques by Paul H. Bardell, W. H. McAnney, J. Savir ISBN: 0-471-62463-2 Publisher: Wiley-Interscience Pub. Date: October, 1987 Format: Hardcover Volumes: 1 List Price(USD): $172.00

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Average Customer Rating: 5 (1 review)

Rating: 5
Summary: BEST TEST BOOK
Comment: This is the best test book I have read. It covers all aspects of BIST with emphasis on pseudorandom techniques. It does not cover as much about testing as "Digital System Testing and Testable Design" but it is well worth its price tag.