AnyBook4Less.com - ISBN: 0471519456 - Secondary Ion Mass Spectrometry : A Practical Handbook for Depth Profiling and Bulk Impurity Analysis by Robert G. Wilson

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Secondary Ion Mass Spectrometry : A Practical Handbook for Depth Profiling and Bulk Impurity Analysis

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Title: Secondary Ion Mass Spectrometry : A Practical Handbook for Depth Profiling and Bulk Impurity Analysis
by Robert G. Wilson, Fred A. Stevie, Charles W. Magee
ISBN: 0-471-51945-6
Publisher: Wiley-Interscience
Pub. Date: November, 1989
Format: Hardcover
Volumes: 1
List Price(USD): $210.00

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Average Customer Rating: 5 (1 review)

Customer Reviews

Rating: 5
Summary: If you do SIMS you need this book!
Comment: A well rounded pratical reference book for the SIMS analyst.

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