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Semiconductor Material and Device Characterization

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Title: Semiconductor Material and Device Characterization
by Dieter K. Schroder
ISBN: 0-471-24139-3
Publisher: Wiley-Interscience
Pub. Date: 19 June, 1998
Format: Hardcover
Volumes: 1
List Price(USD): $125.00
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Average Customer Rating: 5 (1 review)

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Rating: 5
Summary: Semiconductor Material and Device Characterization
Comment: This book offers an outstanding review of various techniques of semiconductor device processing. It is the type of book that is an invaluable reference to the device engineer. It's breadth is outstanding.

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