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Title: Secondary Ion Mass Spectrometry Sims IV: Proceedings of the Fourth International Conference, Osaka, Japan (Springer Series in Chemical Physics 36) by A. Benninghoven, J. Okano, R. Shimizu, H. W. Werner ISBN: 0-387-13316-X Publisher: Springer Verlag Pub. Date: May, 1984 Format: Textbook Binding List Price(USD): $49.50 |
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