AnyBook4Less.com | Order from a Major Online Bookstore |
![]() |
Home |  Store List |  FAQ |  Contact Us |   | ||
Ultimate Book Price Comparison Engine Save Your Time And Money |
![]() |
Title: Transmission Electron Microscopy : A Textbook for Materials Science (4 volumes) by David B. Williams, C. Barry Carter ISBN: 0-306-45324-X Publisher: Plenum Pr Pub. Date: September, 1996 Format: Paperback Volumes: 4 List Price(USD): $83.00 |
Average Customer Rating: 5 (2 reviews)
Rating: 5
Summary: Excellent introduction to TEM
Comment: In the 70's and 80's the book by Hirsch et al. was the TEM reference tome, and Eddington's book the applications manual.
Time has marched on, and this book is the new replacement for both!
Carter and Williams wrote a very easy to read, yet well detailed, text and reference for TEM. They cover quite literally everything, in just the right level of detail for 1st or 2nd year grad students.
This book is the best way to get a quick grasp of TEM.
Rating: 5
Summary: An amazing textbook!
Comment: I find this book probably the best textbook in materials science I ever read. Not only the authors are experts in the field of microscopy, but they also succeeded in extremely difficult task to present the complicated science of electron microscopy in a simple (but not oversimplified!) language. The book covers all major aspects of transmission electron microscopy, and contains excellent illustrations. This book is certainly a priceless asset for students. I talked to some people at the National Center for Electron Microscopy, and they also recommend it as one of the best books at the beginning and intermediate level. If you are looking for a book to learn TEM, get this one, you will never regret!
![]() |
Title: Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein, Dale Newbury, Patrick Kchlin, David C. Joy, Charles E. Lyman, Eric Lifshin, Linda Sawyer, Joseph R. Michael, Mark Staniforth ISBN: 0306472929 Publisher: Kluwer Academic Publishers Pub. Date: February, 2003 List Price(USD): $75.00 |
![]() |
Title: Scanning and Transmission Electron Microscopy: An Introduction by Stanley L. Flegler, John W. Heckman, Karen L. Klomparens ISBN: 0195107519 Publisher: Oxford University Press Pub. Date: June, 1997 List Price(USD): $54.95 |
![]() |
Title: Elements of X-Ray Diffraction (3rd Edition) by B.D. Cullity, S.R. Stock, Stuart Stock ISBN: 0201610914 Publisher: Prentice Hall Pub. Date: 05 February, 2001 List Price(USD): $118.00 |
![]() |
Title: X-Ray Diffraction by B. E. Warren ISBN: 0486663175 Publisher: Dover Pubns Pub. Date: 01 June, 1990 List Price(USD): $16.95 |
![]() |
Title: Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James Howe, Stefaan M. Caenepeel ISBN: 3540437649 Publisher: Springer Verlag Pub. Date: 03 October, 2002 List Price(USD): $89.95 |
Thank you for visiting www.AnyBook4Less.com and enjoy your savings!
Copyright� 2001-2021 Send your comments