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1. |  | Title: Testing Reliability and Application: 24-26 January, 2001, San Jose, California USA (Proceedings of Spie--The International Society for Optical Engineering, V. 4285.) by Aland K. Chin, Niloy K. Dutta, Kurt J. Linden ISBN: 0819439630 Publisher: SPIE--The International Society for Optical Engineering Pub. Date: May, 2001 List Price: $80.00 Amazon.com Price: $80.00 |
| 2. |  | Title: Test and Measurement Applications of Optoelectronic Devices by Kurt J. Linden, Aland K. Chin, Daniel J. McGraw, Niloy Durra, Robert W. Herrick ISBN: 0819443875 Publisher: Society of Photo-Optical Instrumentation Engineers (SPIE) Pub. Date: April, 2002 |
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