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Title: Euv, X-Ray, and Neutron Optics and Sources: 21-23 July 1999, Denver, Colorado (Proceedings of Spie--The International Society for Optical Engineering, V. 3767.) by Carolyn A. Macdonald, Kenneth A. Goldberg, Juan R. Maldonado, Alexander J. Marker, Stephen P. Vernon, Society of Photo-Optical Instrumentation Engineers ISBN: 0-8194-3253-9 Publisher: SPIE--The International Society for Optical Engineering Pub. Date: August, 2000 Format: Hardcover Volumes: 1 List Price(USD): $92.00 |
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