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Machine Vision Systems for Inspection and Metrology VII: 4-5 November, 1998, Boston, Massachusetts (Proceedings of Spie--The International Society for Optical Engineering, V. 3521.)

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Title: Machine Vision Systems for Inspection and Metrology VII: 4-5 November, 1998, Boston, Massachusetts (Proceedings of Spie--The International Society for Optical Engineering, V. 3521.)
by Bruce G. Batchelor, John W. Miller, Susan S. Solomon, Society of Photo-Optical Instrumentation Engineers, Machine Vision Association of Sme
ISBN: 0-8194-2982-1
Publisher: SPIE--The International Society for Optical Engineering
Pub. Date: October, 1998
Format: Hardcover
Volumes: 1
List Price(USD): $89.00
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