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Title: Delay Fault Testing for Vlsi Circuits (Frontiers in Electronic Testing) by Angela Krstic, Kwang-Ting Cheng ISBN: 0-7923-8295-1 Publisher: Kluwer Academic Publishers Pub. Date: 01 September, 1998 Format: Hardcover Volumes: 1 List Price(USD): $152.00

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Average Customer Rating: 5 (1 review)

Rating: 5
Summary: Awsome book on testing!
Comment: This book is the ultimate reference on testing for VLSI circuits. It is a must have if your interest is in delay testing. It is truly superbly written.